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Advancements Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4: Proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics
Barnes and Noble
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Advancements Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4: Proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics in Franklin, TN
Current price: $249.99

Barnes and Noble
Advancements Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4: Proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics in Franklin, TN
Current price: $249.99
Loading Inventory...
Size: Paperback
Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics
, Volume 4 of the
Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics
, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas:
DIC Methods & Its Applications
Photoelsticity and Interferometry Applications
Micro-Optics and Microscopic Systems
Multiscale and New Developments in Optical Methods
Extreme Nanomechanics
In-Situ Nanomechanics
Expanding Boundaries in Metrology
Micro and Nanoscale Deformation
MEMS for Actuation, Sensing and Characterization
1D & 2D Materials
, Volume 4 of the
Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics
, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas:
DIC Methods & Its Applications
Photoelsticity and Interferometry Applications
Micro-Optics and Microscopic Systems
Multiscale and New Developments in Optical Methods
Extreme Nanomechanics
In-Situ Nanomechanics
Expanding Boundaries in Metrology
Micro and Nanoscale Deformation
MEMS for Actuation, Sensing and Characterization
1D & 2D Materials
Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics
, Volume 4 of the
Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics
, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas:
DIC Methods & Its Applications
Photoelsticity and Interferometry Applications
Micro-Optics and Microscopic Systems
Multiscale and New Developments in Optical Methods
Extreme Nanomechanics
In-Situ Nanomechanics
Expanding Boundaries in Metrology
Micro and Nanoscale Deformation
MEMS for Actuation, Sensing and Characterization
1D & 2D Materials
, Volume 4 of the
Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics
, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas:
DIC Methods & Its Applications
Photoelsticity and Interferometry Applications
Micro-Optics and Microscopic Systems
Multiscale and New Developments in Optical Methods
Extreme Nanomechanics
In-Situ Nanomechanics
Expanding Boundaries in Metrology
Micro and Nanoscale Deformation
MEMS for Actuation, Sensing and Characterization
1D & 2D Materials

















